Raman and IR characterization of nanocrystalline Indium Oxide for optoelectronics applications

Nanocrystalline cubic In۲O۳ thin films were successfully synthesized by thermal evaporation of Indium on unheated Si substrates, followed by thermal wet oxidation. The synthesized products were characterized by X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectroscopy, micro-Raman spectroscopy. XRD patterns confirmed the crystalline nature and cubic structure of synthesized composition. Crystallite size and strain were evaluated from the XRD data. The vibrational modes of the samples were investigated by Raman spectrum. The effects of strain and crystalline size of In۲O۳ were studied by FTIR and Raman shifts.

کلیدواژه ها:

Nanocrystalline In۲O۳ ، Si substrates ، FTIR ، micro-Raman spectroscopy