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Modeling of Drain Current in Double-Gate Heterojunction Tunneling FETs: a Physical-Analytical Approach

سال انتشار: 1400
نوع سند: مقاله ژورنالی
زبان: انگلیسی
مشاهده: 38

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شناسه ملی سند علمی:

JR_MSEEE-1-3_001

تاریخ نمایه سازی: 2 مهر 1403

چکیده مقاله Modeling of Drain Current in Double-Gate Heterojunction Tunneling FETs: a Physical-Analytical Approach

In this paper, we develop an analytical potential model for the double-gate Heterostructure Tunneling Field-Effect Transistors (H-TFETs) to accurately predict the electrostatic potential profile of the device in all regions of operation. Using the potential model, we present appropriate relations for the tunneling distance at a specified energy level in the bandgap of the tunneling junction. Finally, based on the highest tunneling rate formalism, the minimum tunneling distance is employed to calculate the tunneling current, which is the dominant on-state current flow mechanism in the H-TFETs. We show that our models closely match the results obtained by numerical simulations, for various heterostructure devices with different material systems in a wide range of operation, from subthreshold to super threshold.

کلیدواژه های Modeling of Drain Current in Double-Gate Heterojunction Tunneling FETs: a Physical-Analytical Approach:

Analytical modeling ، band-to-band tunneling ، double-gate heterostructure tunnel field-effect transistor (H-TFET) ، Drain Current

نویسندگان مقاله Modeling of Drain Current in Double-Gate Heterojunction Tunneling FETs: a Physical-Analytical Approach

Danial Keighobadi

Department of Electrical Engineering, Semnan University, Semnan, Iran

Saeed Mohammadi

Department of Electrical Engineering, Semnan University, Semnan, Iran

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