An overview of determination of Young’s modulus by AFM in various fields

The Atomic Force Microscope (AFM) is a powerful tool for studying the properties and structures of materials at the nanometer scale. Unlike most surface analysis methods, it has no restrictions on surface types or their environment. This versatility allows AFM to investigate a wide range of materials, including conductive, insulating, soft, hard, cohesive, powdered, biological, organic, and inorganic. As such, it finds applications in diverse scientific fields such as chemistry, surface chemistry, polymer science, physics, molecular engineering, semiconductor science, biology, and medicine. Beyond its ability to image surfaces, AFM can also measure mechanical properties like Young's modulus. Young's modulus, also known as the modulus of elasticity (E), is defined as the ratio of stress to strain in the elastic region. This value reflects the stiffness of a material and changes with temperature. This paper explores the application of AFM in measuring Young's modulus across various scientific disciplines.

کلیدواژه ها:

Atomic force microscope ، Young' s modulus ، Force curve ، Elasticity ، Stress ، Strain