An overview of scanning near-field optical microscopy in characterization of nano-materials

سال انتشار: 1393
نوع سند: مقاله ژورنالی
زبان: انگلیسی
مشاهده: 167

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شناسه ملی سند علمی:

JR_IJND-5-3_001

تاریخ نمایه سازی: 24 تیر 1401

چکیده مقاله:

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.

کلیدواژه ها:

Scanning Near-Field Optical Microscopy ، Scanning probe microscope ، Nano structures ، Optical microscopy ، Aperture less SNOM ، Photon scanning tunneling microscopy ، Optical fiber

نویسندگان

Z. Sobat

Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: ۱۴۸۵۷۳۳۱۱۱, Tehran, Iran.

S. Sadegh Hassani

Catalysis and nanotechnology research division, research institute of petroleum industry, P. O. Box: ۱۴۸۵۷۳۳۱۱۱, Tehran, Iran.