Low Power March Memory Test Algorithm for Static Random Access Memories (TECHNICAL NOTE)

سال انتشار: 1396
نوع سند: مقاله ژورنالی
زبان: انگلیسی
مشاهده: 301

فایل این مقاله در 7 صفحه با فرمت PDF قابل دریافت می باشد

استخراج به نرم افزارهای پژوهشی:

لینک ثابت به این مقاله:

شناسه ملی سند علمی:

JR_IJE-31-2_013

تاریخ نمایه سازی: 10 آذر 1398

چکیده مقاله:

Memories are most important building blocks in many digital systems. As the Integrated Circuits requirements are growing, the test circuitry must grow as well. There is a need for more efficient test techniques with low power and high speed. Many Memory Built in Self-Test techniques have been proposed to test memories. Compared with combinational and sequential circuits memory testing utilizes more amount of power. Test circuitry is intensively used for memory testing. This may cause excessive power consumption during memory testing. Sophisticated and efficient techniques with less overhead on power must be needed. Regarding memories, power consumption is very much high during testing when compared with normal functional mode. March test algorithms are popular testing techniques used for memory testing. Power consumption during testing can be reduced by reducing the switching activity in test circuitry. A new test technique is proposed in this paper to reduce power consumption in test mode by reducing the switching activity in Built in Self-Test circuitry. Address sequencing in the address decoder is changed in such a way that it reduces switching activity.

کلیدواژه ها:

نویسندگان

Rajesh Kumar Godi

Palakoderu Mandal, Goraganamudi

Banulu K

ECE, JNTUK, Kakinada