Physical Studies of RF Magnetron Sputtered CdS Thin Film on FTO Substrate

Cadmium sulfide (CdS) thin films are deposited on the fluorine doped tin oxide (FTO) coated glass substrate using the radio frequency (RF) magnetron sputtering setup. The effects of annealing in air on the structural, morphological and optical properties of CdS thin film are studied. Optimal annealing temperature is investigated by annealing the CdS thin film at different annealing temperatures of ۳۰۰, ۴۰۰ and ۵۰۰°C. Thin films of CdS are characterized by X-ray diffractometer (XRD) analysis, field emission scanning electron microscopy (FESEM), atomic force microscopy (AFM), UV-Vis-NIR spectrophotometer and four point probe. The as-grown CdS films are found to be polycrystalline in nature with a mixture a cubic phase. By increasing the annealing temperature to ۵۰۰°C, CdS film showed hexagonal phase, indicating the phase transition of CdS. It is found from physical characterizations that the heat treatment in air changed the transition phase and increased the mean grain size and the transmission of the CdS film, which are advantageous to the application in solar cells as a window layer material.

کلیدواژه ها:

RF Sputtering ، CdS ، Post annealing ، Band gap ، FESEM