Defects detection in PTFE using VMD analysis and Infrared Thermography

In this study , Variable Mode Decomposition (VMD) and infrared thermography was employed to enhance the detection of defects in PTFE samples. PTFE sheet with ۲۵ simulated flat-bottomed holes of varying diameters depths were prepared . Initial thermal images exhibited low contrast and high noise, making defect detection difficult. As a result, the detection capability improved from ۴۸% and ۶۸% to ۹۶% after VMD application. This method made it possible to detect smaller and deeper defects by increasing the contrast between healthy and defective areas and removing noise. In addition, VMD was able to overcome challenges such as non-uniform heating and low signal-to-noise ratio that existed in traditional methods. These results show the importance of using advanced image processing methods, especially VMD, in improving the quality and accuracy of non-destructive testing.

کلیدواژه ها:

PTFE (Polytetrafluoroethylene) ، Infrared Thermography ، Non-destructive evaluation ، VMD (Variational Mode Decomposition)