Does Occupational Exposure of Shahid Dastghieb International Airport Workers to Radiofrequency Radiation Affect Their Short Term Memory and Reaction Time?

سال انتشار: 1394
نوع سند: مقاله ژورنالی
زبان: انگلیسی
مشاهده: 45

فایل این مقاله در 8 صفحه با فرمت PDF قابل دریافت می باشد

استخراج به نرم افزارهای پژوهشی:

لینک ثابت به این مقاله:

شناسه ملی سند علمی:

JR_JBPE-5-3_006

تاریخ نمایه سازی: 30 دی 1402

چکیده مقاله:

Background: Airport workers are continuously exposed to different levels of radiofrequency microwave (RF/MW) radiation emitted by radar equipments. Radars are extensively used in military and aviation industries. Over the past several years, our lab has focused on the health effects of exposure to different sources of electromagnetic fields such as cellular phones, mobile base stations, mobile phone jammers, laptop computers, radars, dentistry cavitrons and MRI. The main goal of this study was to investigate if occupational exposure of Shahid Dastghieb international airport workers to radiofrequency radiation affects their short term memory and reaction time.Methods: Thirty two airport workers involved in duties at control and approach tower (۲۱ males and ۱۱ females), with the age range of ۲۷-۶۷ years old (mean age of ۳۷.۳۸), participated voluntary in this study. On the other hand, ۲۹ workers (۱۳ males, and ۱۶ females) whose offices were in the city with no exposure history to radar systems were also participated in this study as the control group. The employees’ reaction time and short term memory were analyzed using a standard visual reaction time (VRT) test software and the modified Wechsler memory scale test, respectively.Results: The mean± SD values for the reaction times of the airport employees (N=۳۲) and the control group (N=۲۹) were ۰.۴۵±۰.۱۲ sec and ۰.۴۶±۰.۱۷ sec, respectively.  Moreover, in the four subset tests; i.e. paired words, forward digit span, backward digit span and word recognition, the following points were obtained for the airport employees and the control group, respectively: (i) pair words test: ۲۸.۰۰±۱۳.۱۳ and ۳۲.۰۷±۱۱.۶۵, (ii) forward digit span: ۸.۳۸±۱.۴۰ and ۹.۰۳±۱.۳۲, (iii) backward digit span: ۵.۵۴±۱.۸۷ and ۶.۳۱±۱.۴۶, and (iv) word recognition: ۵.۷۳±۲.۳۶ and ۶.۵۰±۱.۹۳. These differences were not statistically significant.Conclusion: The occupational exposure of the employees to the RF radiation in Shahid Dastghieb international airport does not have any significant detrimental effect on their reaction time as well as short term memory.Â