A review of the effect of electrostatic discharge (ESD) on MOSFET and several solutions
سال انتشار: 1400
نوع سند: مقاله کنفرانسی
زبان: انگلیسی
مشاهده: 316
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شناسه ملی سند علمی:
SETT02_007
تاریخ نمایه سازی: 23 اسفند 1400
چکیده مقاله:
Static electricity and electrostatic discharge (ESD) has become a serious concern of both device manufacturers and users; Virtually all semiconductor devices are more or less sensitive to ESD, and the problem is further compounded by the omnipresence of static electricity. MOSFETs (metal-oxide-semiconductor field-effect transistors) are particularly susceptible to destruction by ESD because a thin gate the oxide layer is inherent in any MOS system. we in this article check any solutions for solve this problem.
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نویسندگان
Mostafa Khoshnoud
Electronic Engineering Department, Chamran University, Guilan.Iran
Saeed Rezaei
Student of Electronic Engineering, Chamran University, Guilan.Iran