A review of the effect of electrostatic discharge (ESD) on MOSFET and several solutions

سال انتشار: 1400
نوع سند: مقاله کنفرانسی
زبان: انگلیسی
مشاهده: 316

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شناسه ملی سند علمی:

SETT02_007

تاریخ نمایه سازی: 23 اسفند 1400

چکیده مقاله:

Static electricity and electrostatic discharge (ESD) has become a serious concern of both device manufacturers and users; Virtually all semiconductor devices are more or less sensitive to ESD, and the problem is further compounded by the omnipresence of static electricity. MOSFETs (metal-oxide-semiconductor field-effect transistors) are particularly susceptible to destruction by ESD because a thin gate the oxide layer is inherent in any MOS system. we in this article check any solutions for solve this problem.

نویسندگان

Mostafa Khoshnoud

Electronic Engineering Department, Chamran University, Guilan.Iran

Saeed Rezaei

Student of Electronic Engineering, Chamran University, Guilan.Iran