An LFSR based method for concurrent BIST in logic circuits

Built in self-test (BIST) is the capability of hardware/software to test by itself. BIST techniques are divided into two categories namely offline and online. In this paper, a new method based on duplication system test for concurrent online test is presented. Analysis of linear feedback shift register (LFSR) is our main focus to solve challenges and get our objects. This Concurrent online method is based on pre-computed test set which These efficient vectors are calculated by our own method instead of a deterministic test pattern generation algorithm. Area over head is decreased 48.2% compared to the previous methods. For large scale circuits this parameter is recorded low percentages. In addition to this, getting our test vectors by our own method makes us able to tradeoff between different parameters like fault coverage and area overhead.

کلیدواژه ها:

Concurrent self test ، BIST ، Test generation ، Fault simulation