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مقالات بین المللی خارج از کشور

"Study and Calculation Electrical Properties of Silver Thin Layers by Four- Point Probe Method", OMICS Publishing Group, (2017), Vol 04, No 01:
"Demonstrating existence of one suitable oxide phase concurrent with formation of Ti/p-Si Schottky junction by comparing direct calculation with analysis", Emerald, (2017), Vol 14, No 4: 284-288

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