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Temperature Effect Investigation of ۴۵nm Silicon-on-Diamond MOSFET Transistors

عنوان مقاله: Temperature Effect Investigation of ۴۵nm Silicon-on-Diamond MOSFET Transistors
شناسه ملی مقاله: JR_MJEE-3-1_004
منتشر شده در در سال 1388
مشخصات نویسندگان مقاله:

Arash Daghighi - Shahrekord University
Azar Farajzadeh

خلاصه مقاله:
The self-heating effects (SHE) in ۴۵nm Silicon-on-Insulator (SOI) and Silicon-on-Diamond (SOD) structures were investigated. As a result of high thermal conductivity of diamond, SHE is much less pronounced in SOD structures. This makes SOD transistors suitable for high power applications were large power density is required. It was shown that in SOD substrate the generated heat in active transistors not only spreads away in the substrate but also transfers to the auxiliary non-active transistors on the same die through the diamond film. Our hydrodynamic simulation results showed ۸ times more off-current in auxiliary transistors than SOI substrate. The thermal coupling between the neighboring devices in SOD structures represent device miss-match in analog circuits were high degree of matching is required.

کلمات کلیدی:
Silicon on Insulator MOSFET, en, Body Contact, body resistance, Output Conductance, Self-Heating Effects

صفحه اختصاصی مقاله و دریافت فایل کامل: https://civilica.com/doc/1634400/