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Observation Mexican-hat in the strained monolayer MSb (M = C, Si, Ge and Sn)

عنوان مقاله: Observation Mexican-hat in the strained monolayer MSb (M = C, Si, Ge and Sn)
شناسه ملی مقاله: ICNNA02_276
منتشر شده در دومین همایش بین المللی علوم و فناوری نانو دانشگاه تهران در سال 1400
مشخصات نویسندگان مقاله:

Ashkan Rajabi maram
Nona Hasani
Shoeib Babaee touski

خلاصه مقاله:
In this work, the electrical properties of MSb (M = C, Si, Ge and Sn) monolayers are investigated. The electrical properties such as effective mass, deformation potential and mobility of these monolayers along both zigzag and armchair directions are studied. In this compounds, the hole in the valence band demonstrates a higher mobility respect to electron. We find that these compounds show a Mexican-hat dispersion at the top of valence for large tensile strain. The Mexican-hat energy and coefficient are explored for various strains

کلمات کلیدی:
Monolayer, Electronic Properties, DFT, Mexican-hat

صفحه اختصاصی مقاله و دریافت فایل کامل: https://civilica.com/doc/1274892/