Using Maximum Variance Index of Fuzziness for contrast enhancement of Nano and micro-images of TEM
محل انتشار: ششمین کنفرانس ماشین بینایی و پردازش تصویر ایران
سال انتشار: 1389
نوع سند: مقاله کنفرانسی
زبان: انگلیسی
مشاهده: 1,839
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شناسه ملی سند علمی:
ICMVIP06_080
تاریخ نمایه سازی: 20 فروردین 1390
چکیده مقاله:
Transmission electron microscopy (TEM) is one of the most useful methods to clarify the structure in micro and Nano materials. We developed a quantitative analysis method for structure identification of Nano materials containing Nano-space by using electron microscopy combined with a contrast enhancement technique. In this paper an entropic-like index of fuzziness is presented to be an indication of information transfer from a TEM image to its enhanced one. The image is firstly transmitted to fuzzy domain. The membership values are then modified according to a 5-parametric transfer function aiming to maximize the maximum variance index of fuzziness. In the proposed index of fuzziness, the Sugeno class of complement is employed to make the index more adaptable and flexible to various types of applications a TEM image may involve. A common involvement of microscopic image processing techniques is the non-uniform backlight illumination of the images. To this aim, the image is split into sub-images of with quite uniform illumination and then the segments are analyzed separately. An implementation and simulation is performed finally to demonstrate the effectiveness, adaptability and generally applicability of the proposed method in case of microscopic Nano-scale image enhancement.
کلیدواژه ها:
Transmission Electron Microscopy (TEM) ، Nano-material image analysis ، Index of fuzziness ، Sugeno complement
نویسندگان
Omid Khayat
Department of Nuclear Engineering and Physics, Amirkabir University of Technology
Ehsan Noori
aDepartment of Nuclear Engineering and Physics, Amirkabir University of Technology
Mitra Ghergherehchi
aDepartment of Nuclear Engineering and Physics, Amirkabir University of Technology
Hossein Afarideh
Department of Nuclear Engineering and Physics, Amirkabir University of Technology